An In-Depth Look at Test Probes: The Role of High Frequency, RF and High Current Applications

A test probe is an electronic component used to test the signal and quality of electronic circuits.probe test system It is capable of picking up signals non-destructively and providing them to the appropriate test system for analysis.

The current signal flows through the cable bundle of the tester to the probe sleeve and is then transmitted via the probe tip to the point to be tested, where it reaches the device under test and then returns to the test instrument along the same path.

The working principle of the test probe is to test the open and short circuit parameters of the circuit board by means of the current signal transmitted by the probe. The test system inputs the transmitted current into the device under test and measures the response of the device to the input signal.

There are different structures and applications for test probes. From the structure can be divided into shrapnel probes, cantilever probes, vertical probes;RF probes from the application areas can be divided into semiconductor test probes, high-frequency test probes, radio-frequency test probes, high-current test probes, conventional ICT probes and so on.

This article mainly introduces the test probes in the high-frequency test probes, radio frequency test probes, high-current test probes.

High-frequency test probes with small impedance and loss-resistant features, is the PCB board, high-speed digital circuit boards, wafers, microwave chip test in one of the essential tools. High frequency test probes have a variety of head types to choose from, and can be set according to the customer's requirements of the length of the high-frequency wire and different wire types. Its lowest frequency can reach 2.4GHz with attenuation of -1.5dB, which has good performance in testing laptop computers, wireless network cards, and Bluetooth. High frequency test probes can meet a variety of testing needs, reliable connection and easy to use.

RF test probes are made of beryllium copper material, which has excellent conductivity and can keep the contact point position stable for a long time, so it has good durability. It plays an important role in microswitch, plug connector and circuit board testing. probe cardRF product technology development, parameter extraction, performance debugging and production testing of each link is inseparable from the RF test probes. The use of RF test probes allows the characterization of RF components to be measured at the wafer level, while reducing test time and development costs.

High-current test probes have high test currents and are able to pass high temperature and high current tests to meet a wide range of test requirements. High-current probes are required in many industries that use high currents. On the one hand, it is widely used in various function tests, signal transmission, production tests and as a built-in tactile element; on the other hand, it is used for accurate testing, which requires the use of high current test probes with very low internal resistance. For example, in BTB/FPC connector testing, high current test probes can transmit large currents and maintain a stable connection.

The conductivity of a high current test probe depends on its internal factors, such as the area of the probe core, the conductivity of the material and the conductivity of the insulation layer. The thicker the probe core, the higher the purity of the copper in the conductive material, and the better the thermal conductivity of the insulating material, the higher the conductivity and the higher the current carrying capacity of the high current test probes.